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Central Lab

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Central Laboratory Introduction

The central lab  is public test service platform of Sunlord and has a Material  Analysis Lab, Failure Analysis Lab, a Reliability Test Lab, an Electrical Research Lab, a Simulation Lab and a Pilot Lab. The central lab owns numerous advanced imported test instruments and simulation softwares which provide structure analysis, material characterization, failure mechanism analysis, electrical specification research, EMC test , magnetism devices simulation, R&D experiments and small-lot production of electronic materials.

The central lab founded in 2011 covers an area about 5000m2 and owns equipment assets more than fifty million RMB. The central lab has more than sixty professional experimenters and an expert consultants team made up with product managers, R&D engineers and quality engineers. The central lab rooted in the localization has a wide and deep cooperation with equipment suppliers, third-party test organizations and colleges and universities and provide strong technique support and all-directional test services for internal and external customers.
"Sunlord-key sight Electronic Measurement Joint Laboratory" was established in september,2016.Measuring and testing technique research,testing platform construction and talent cultivation can be conducted at the joint laboratory to meet Sunlord’s needs.
In order to enhance management level and technical capacity,CNAS Accreditation project was started in september,2016 by the central lab.The quality management systems was eatablished in december,2016 according to ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration Laboratories.The central lab acquired CNAS accreditation in december,2017.   
 
 
          
              
                      
Services

 

  • Microstructure analysis and characterization, element analysis
  • Rheological ans heated changed behaviors analysis
  • Failure analysis of electron components
  • Reliability tests
  • Electric performance test of electronics
  • R & D experiments of electronic materials and production manufactured experiments from the production of sample prototype to small batch manufacturing. 

 

CNAS Accreditation Test Items List

Test object
Item/ Parameter
Code of field
Title Code of standard or method
Note
Expansion or change
№.
Item/ Parameter
1
Electronic components and raw materials (powder, block solid)
1
Surface microstructure
030512
General rules for analytical scanning electron microscopy JYT 010-1996
 
 
2
Phase analysis
030513
General rules for X-ray polycrystalline diffraciometry JYT 009-1996 4.1 Qualitative analysis of phase composition
 
 
2
The precious metal paste used in electronic components
1
Viscosity
030508
Test methods of precious metals pastes used for microelectronicsDetermination of viscosity GB_T 17473.5-2008
 
 
3
Ceramic material
1
Differential thermal curve
030507
Standard test method for differential thermal analysis of row materials of ceramic GB/T 6297-2002
 
 
4
Fine ceramic material ( block solid)
1
coefficient of thermal expansion
050999
Fine ceramicsadvanced ceramics,advanced technical ceramics)—Test method for linear expansion of monolithic ceramics by push-rod technique GB/T 16535-2008
 
 
5
Powder particles
1
Specific surface area
030504
Determination of the Specific surface area of solids by gas adsorption using the BET method GB/T 19587-2004
 
 
2
Particle size analysis
030502
Particle size analysisLaser diffraction methods GB∕T 19077-2016
 
 
6
Electronic components of the structure of ceramic materials
1
dielectric constant
041509
Structure ceramic materials used in electronic component and device GB/T 5593-2015 5.11 permittivity and
dielectric loss angle tangent value
 
 
Test method for complex permittivity of solid dielectric materials at microwave frequencies GB/T 5597-1999
 
 
2
Dielectric loss Angle tangent value
041504
Structure ceramic materials used in electronic component and device, GB/T 5593-2015 5.11 permittivity and
dielectric loss angle tangent value
 
 
Test method for complex permittivity of solid dielectric materials at microwave frequencies GB/T 5597-1999
 
 
Test method for properties of structure ceramic used in electronic component and device-Part 4: Test method for permittivity anddielectric loss angle tangent value GB/T 5594.4-2015
 
 
7
Soft ferrite material
1
Hysteresis loop
030404
Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
 
 
2
Saturation magnetic flux density(Bs
030404
Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
 
 
3
Remanence(Br)
030404
Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
 
 
4
CoercivityHc)
030404
Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
 
 
5
Power consumption
030404
Measuring methods for soft ferrite materials SJ 20966-2006 8.2 Power consumption
 
 
8
Nanohenry range chip inductor
1
Inductance
040602
High frequency inductive components Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 3.1 Inductance
 
 
2
Quality factor
040602
High frequency inductive components Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 3.2 Quality factor
 
 
3
Impedance
040602
High frequency inductive components Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 3.3 Impedance
 
 
4
Self-resonance frequency
040602
High frequency inductive components Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 4Resonance frequency
 
 
5
DC resistance
040602
High frequency inductive components Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 5 DC resistance
 
 
9
Varistor
1
leakage current
040601
Varistors for in electronic equipmentPart1:Generic specification GB/T 10193-1997 2.2.13 leakage current
 
 
2
varistor voltage
040601
Generic specification for varistors GJB 1782A-2015 3.8 varistor voltage
 
 
10
Passive device
1
Insertion loss
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.2
 
 
2
ripple in band
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.3
 
 
3
Amplitude Unbalance (only for power splitter)
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.4
 
 
4
Coupling and tolerances (couplers only)
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.5
 
 
5
Isolation
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.6
 
 
6
Rejction of Out band
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.7
 
 
7
Voltage Standing Wave Ratio
040699
Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.9
 
 
11
Electronic Component
1
The grinding and polishing of the specimen, the cross section of the metal layer
030202
Metallic coatingsMeasurement of coating thickness—Scanning electron microscope method GB/T 31563-2015 
 
 
2
Surface metallographic analysis
030202
Inspection methods of microstructure for metals GBT 13298-2015
 
 
3
PCB board bending test
040118
Environmental testing for electric and eletronic productsPart 2:Test methods—Test U:Robustness of terminations and integral mounting devices GB/T 2423.60-2008 8.5.1
 
 
4
Shear (adhesion) test
040118
Environmental testing for electric and eletronic productsPart 2:Test methods—Test U:Robustness of terminations and integral mounting devices GB/T 2423.60-2008 8.5.3
 
 
5
Free fall test
040108
Environmental testing for electric and eletronic productsPart 2:Test methods—Test Ed:Free fall GB/T 2423.8-1995 The first method
 
 
6
Package drop test
040199
PackagingTransport packages—Vertical impact test method by droping GB/T 4857.5-92
 
 
7
Roller drop test
040199
Environmental testing for electric and eletronic productsPart 2:Test methods—Test Ed:Free fall GB/T 2423.8-1995 The second method
 
 
8
Low frequency vibration test
040107
Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 201
 
 
9
High frequency vibration test
040107
Environmental testing for electric and eletronic productsPart 2:Test methods—Test Fc:Vibration(Sinusoidal) GB/T 2423.10-2008
 
 
10
Random vibration test
040107
Environmental testing for electric and eletronic productsPart 2:Test methods—Test Fh:Vibration,broad-band random(digital control)and guidance GB/T 2423.56-2006
 
 
11
Mechanical Shock Test
040105
GB/T 2423.5-1995Environmental testing for electric and electronic products-Part 2 :Test methods-Test Ea and guidance:Shock GB/T 2423.5-1995
 
 
12
Resistance to Soldering Heat
040117
Environmental testing for electric and electronic products-Part 2 :Test methods-Test T:Soldering GB/T 2423.28-2005 Test Tb
 
 
13
Solderability Test
040117
Environmental testing for electric and electronic products-Part 2 :Test methods-Test T:Soldering GB/T 2423.28-2005 Test Ta
 
 
14
Thermal Shock Test-Air to Air
040114
Environmental testing for electric and electronic products-Part 2 :Test methods-Test N:Change of temperature GB/T 2423.22-2012 Test Na
Temperature range: high temperature +60, ~+200℃, low temperature -70℃, ~0℃;
Internal volume: 110L
 
15
Temperature Cycling Test
040114
Environmental testing for electric and electronic products-Part 2 :Test methods-Test N:Change of temperature GB/T 2423.22-2012 Test Nb
Temperature range: -40, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
 
16
Low Temperature Storage Test
040101
Environmental testing for electric and electronic products-Part 2 :Test methods-Test A:Cold GB/T 2423.1-2008 5.2 Test Ab
Temperature range: -75, ~+150℃
Internal volume: 60L
 
17
High Temperature Storage Test
040102
Environmental testing for electric and electronic products-Part 2 :Test methods-Test B:Dry heat GB/T 2423.2-2008 5.2 Test Bb
Temperature range: RT~+200
Internal volume: 252L
 
18
Steady State Temperature Humidity Life Test
040103
Environmental testing for electric and electronic products-Part 2 :Test methods-Test Cy:Damp heat,steady state,acceleerated test primarily intended for components GB/T 2423.50-2012
Temperature range: -40, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
 
19
Damp Heat Test
040103
Environmental testing for electric and electronic products-Part 2 :Test methods-Test Cab:Damp heat,steady state GB/T 2423.3-2006
Temperature range: -40, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
 
20
Temperature and humidity combined cycle test
040104
Environmental testing for electric and electronic products-Part 2 :Test methods-Test Db:Damp heat,cyclic GB/T 2423.34-2012  
Temperature range: -40, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
 
21
Salt Spray test
040119
Environmental testing for electric and electronic products-Part 2 :Test methods-Test Ka:Salt mist GB/T 2423.17-2008
Internal volume: 270L
 
22
electric capacity
040699
Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 305 
 
 
23
dielectric withstand voltage
041509
Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 301
 
 
24
dielectric resistance
041502
Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 302